Parametrization of the Gaussian Disorder Model to Account for the High Carrier Mobility in Disordered Organic Transistors

Yongjeong Lee, Sungyeop Jung, Andrew Plews, Ahmed Nejim, Olivier Simonetti, Louis Giraudet, Sergei D. Baranovskii, Florian Gebhard, Klaus Meerholz, Sungjune Jung, Gilles Horowitz, and Yvan Bonnassieux
Phys. Rev. Applied 15, 024021 – Published 9 February 2021

Abstract

Correct parameterization of the Gaussian disorder model (GDM) on spatially random sites is necessary for a complete description of charge transport in disordered materials and concomitant device characteristics. Because the GDM on spatially random sites considers both energetic and spatial disorder, it is superior to the GDM on a cubic lattice. However, analytical arguments and experimental evidence are still lacking for correct parameterization of the model over a wide range of model parameters, energetic and spatial disorder, and electric fields. We show that the model requires a set of parameters to correctly account for high mobility and its charge density dependence, and we develop such a model. The model is implemented in a numerical simulation tool for comparison with the measured device characteristics. Accurate agreement with experimental data, particularly with the high mobility values in organic field-effect transistors, is achieved throughout a wide range of temperature by adjusting both the localization length and the attempt-to-escape frequency.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
2 More
  • Received 14 September 2020
  • Revised 20 December 2020
  • Accepted 8 January 2021

DOI:https://doi.org/10.1103/PhysRevApplied.15.024021

© 2021 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Yongjeong Lee1, Sungyeop Jung2,3,4,*, Andrew Plews5, Ahmed Nejim5, Olivier Simonetti6, Louis Giraudet6, Sergei D. Baranovskii7,8, Florian Gebhard7, Klaus Meerholz8, Sungjune Jung2,3, Gilles Horowitz1, and Yvan Bonnassieux1

  • 1LPICM, CNRS UMR 7647, Ecole polytechnique, Institut Polytechnique de Paris, Palaiseau 91128, France
  • 2Future IT Innovation Laboratory (i-LAB), Pohang University of Science and Technology (POSTECH), Pohang 37673, Republic of Korea
  • 3Department of Convergence IT Engineering, POSTECH, Pohang 37673, Republic of Korea
  • 4Advanced Institute of Convergence Technology, Seoul National University, Suwon 16229, Republic of Korea
  • 5Silvaco Europe Ltd., Cambridgeshire PE27 5JL, United Kingdom
  • 6LRN-EA 4682, Université de Reims Champagne Ardenne, 51687 Reims Cedex 02, France
  • 7Faculty of Physics and Material Sciences Center, Philipps-Universitat, 35032 Marburg, Germany
  • 8Department für Chemie, Universität zu Köln, Luxemburger Strasse 116, 50939 Köln, Germany

  • *sungyeop.jung@snu.ac.kr

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 15, Iss. 2 — February 2021

Subject Areas
Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Applied

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×