Simultaneous Optical and Electrical Spin-Torque Magnetometry with Phase-Sensitive Detection of Spin Precession

Yi Li, Hilal Saglam, Zhizhi Zhang, Rao Bidthanapally, Yuzan Xiong, John E. Pearson, Valentine Novosad, Hongwei Qu, Gopalan Srinivasan, Axel Hoffmann, and Wei Zhang
Phys. Rev. Applied 11, 034047 – Published 19 March 2019
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Abstract

Spin-based coherent information processing and encoding utilize the precession phase of spins in magnetic materials. However, the detection and manipulation of spin precession phases remain a major challenge for advanced spintronic functionalities. By using simultaneous electrical and optical detection, we demonstrate the direct measurement of the spin precession phase of a permalloy device driven by the spin-orbit torques from adjacent heavy metals. The spin Hall angle of the heavy metals can be independently determined from concurrent electrical and optical signals. The phase-sensitive optical detection also allows spatially-resolved measurements of local spin-torque parameters and ferromagnetic resonance with comprehensive amplitude and phase information. Our study offers a route toward future advanced characterizations of spin-torque oscillators, magnonic circuits, and tunneling junctions, where measuring the current-induced spin dynamics of individual nanomagnets is required.

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  • Received 24 November 2018
  • Revised 9 February 2019

DOI:https://doi.org/10.1103/PhysRevApplied.11.034047

© 2019 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Yi Li1,2, Hilal Saglam2,3, Zhizhi Zhang2,4, Rao Bidthanapally1, Yuzan Xiong5, John E. Pearson2, Valentine Novosad2, Hongwei Qu5, Gopalan Srinivasan1, Axel Hoffmann2,*, and Wei Zhang1,2,†

  • 1Department of Physics, Oakland University, Rochester, Michigan 48309, USA
  • 2Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
  • 3Department of Physics, Illinois Institute of Technology, Chicago Illinois 60616, USA
  • 4School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China
  • 5Department of Electrical and Computer Engineering, Oakland University, Rochester, Michigan 48309, USA

  • *hoffmann@anl.gov
  • weizhang@oakland.edu

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Issue

Vol. 11, Iss. 3 — March 2019

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