Angle-resolved x-ray spectroscopic scheme to determine overlapping hyperfine splittings in highly charged heliumlike ions

Z. W. Wu, A. V. Volotka, A. Surzhykov, and S. Fritzsche
Phys. Rev. A 96, 012503 – Published 5 July 2017

Abstract

An angle-resolved x-ray spectroscopic scheme is presented for determining the hyperfine splitting of highly charged ions. For heliumlike ions, in particular, we propose to measure either the angular distribution or polarization of the 1s2pP13,F1s2S01,Ff emission following the stimulated decay of the initial 1s2sS01,Fi level. It is found that both the angular and polarization characteristics of the emitted x-ray photons strongly depend on the (relative) splitting of the partially overlapping hyperfine 1s2pP13,F resonances and may thus help resolve their hyperfine structure. The proposed scheme is feasible with present-day photon detectors and allows a measurement of the hyperfine splitting of heliumlike ions with a relative accuracy of about 104.

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  • Received 3 April 2017

DOI:https://doi.org/10.1103/PhysRevA.96.012503

©2017 American Physical Society

Physics Subject Headings (PhySH)

Atomic, Molecular & Optical

Authors & Affiliations

Z. W. Wu1,2, A. V. Volotka1,3, A. Surzhykov4,5, and S. Fritzsche1,6

  • 1Helmholtz-Institut Jena, D-07743 Jena, Germany
  • 2Key Laboratory of Atomic and Molecular Physics & Functional Materials of Gansu Province, College of Physics and Electronic Engineering, Northwest Normal University, Lanzhou 730070, People's Republic of China
  • 3Department of Physics, St. Petersburg State University, 198504 St. Petersburg, Russia
  • 4Physikalisch-Technische Bundesanstalt, D-38116 Braunschweig, Germany
  • 5Technische Universität Braunschweig, D-38106 Braunschweig, Germany
  • 6Theoretisch-Physikalisches Institut, Friedrich-Schiller-Universität Jena, D-07743 Jena, Germany

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Issue

Vol. 96, Iss. 1 — July 2017

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