Abstract
An angle-resolved x-ray spectroscopic scheme is presented for determining the hyperfine splitting of highly charged ions. For heliumlike ions, in particular, we propose to measure either the angular distribution or polarization of the emission following the stimulated decay of the initial level. It is found that both the angular and polarization characteristics of the emitted x-ray photons strongly depend on the (relative) splitting of the partially overlapping hyperfine resonances and may thus help resolve their hyperfine structure. The proposed scheme is feasible with present-day photon detectors and allows a measurement of the hyperfine splitting of heliumlike ions with a relative accuracy of about .
- Received 3 April 2017
DOI:https://doi.org/10.1103/PhysRevA.96.012503
©2017 American Physical Society