Abstract
Vector-field electron tomography (VFET) reconstructs electromagnetic vector fields of magnetic nanomaterials using transmission electron microscopy. The theory behind this reconstruction process is well established, but the practical implications of experimental errors and how they affect the accuracy of the reconstructed vector fields is not well understood, hindering progress in the use of these techniques for routine magnetic characterization of nanomaterials. Here, we present an analysis of the propagation of stochastic errors through a VFET algorithm. A method for determining the contribution of image noise to errors in a reconstructed vector potential is derived. Simulations are performed to test the validity of this method when applied to shot noise, which shows good agreement with theory.
3 More- Received 12 May 2014
DOI:https://doi.org/10.1103/PhysRevA.90.023859
Published by the American Physical Society