Degrees of polarization of the two strongest 5f3d lines following electron-impact excitation and dielectronic recombination processes of Cu-like to Se-like gold ions

Z. W. Wu, C. Z. Dong, and J. Jiang
Phys. Rev. A 86, 022712 – Published 22 August 2012

Abstract

Cross sections for electron-impact excitation and capture to individual magnetic sublevels of Cu-like to Se-like gold ions have been calculated by using a fully relativistic distorted-wave (RDW) method. These magnetic cross sections have further been used to obtain the degrees of linear polarization for the first two strongest 5f3d radiative lines. A detailed comparison has been made between polarizations of these lines from the electron-impact excitation process and those of the same lines but from the dielectronic recombination process. It is found that for a Cu-like gold ion the polarization in the electron-impact excitation process increases sharply before starting to decrease at higher incident electron energies, and it reaches the maximum at around twice the threshold energy. The situations for other gold ions are very similar. However, as for the dielectronic recombination process, the polarization changes among a very large range with different gold ions. Therefore, the obvious differences between the polarizations from different formation processes can be employed in diagnosing the formation mechanism of the corresponding lines.

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  • Received 20 May 2012

DOI:https://doi.org/10.1103/PhysRevA.86.022712

©2012 American Physical Society

Authors & Affiliations

Z. W. Wu, C. Z. Dong*, and J. Jiang

  • Key Laboratory of Atomic and Molecular Physics & Functional Materials of Gansu Province, College of Physics and Electronic Engineering, Northwest Normal University, Lanzhou 730070, People's Republic of China

  • *Corresponding author: dongcz@nwnu.edu.cn

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Vol. 86, Iss. 2 — August 2012

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