Optimization of quantum interferometric metrological sensors in the presence of photon loss

Tae-Woo Lee, Sean D. Huver, Hwang Lee, Lev Kaplan, Steven B. McCracken, Changjun Min, Dmitry B. Uskov, Christoph F. Wildfeuer, Georgios Veronis, and Jonathan P. Dowling
Phys. Rev. A 80, 063803 – Published 2 December 2009

Abstract

We optimize two-mode entangled number states of light in the presence of loss in order to maximize the extraction of the available phase information in an interferometer. Our approach optimizes over the entire available input Hilbert space with no constraints, other than fixed total initial photon number. We optimize to maximize the Fisher information, which is equivalent to minimizing the phase uncertainty. We find that in the limit of zero loss, the optimal state is the maximally path-entangled (so-called N00N) state, for small loss, the optimal state gradually deviates from the N00N state, and in the limit of large loss, the optimal state converges to a generalized two-mode coherent state, with a finite total number of photons. The results provide a general protocol for optimizing the performance of a quantum optical interferometer in the presence of photon loss, with applications to quantum imaging, metrology, sensing, and information processing.

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  • Received 5 July 2009

DOI:https://doi.org/10.1103/PhysRevA.80.063803

©2009 American Physical Society

Authors & Affiliations

Tae-Woo Lee1, Sean D. Huver2, Hwang Lee2, Lev Kaplan3, Steven B. McCracken2, Changjun Min1, Dmitry B. Uskov3, Christoph F. Wildfeuer2, Georgios Veronis1,4, and Jonathan P. Dowling2

  • 1Center for Computation and Technology, Louisiana State University, Baton Rouge, Louisiana 70803, USA
  • 2Hearne Institute for Theoretical Physics, Department of Physics and Astronomy, Louisiana State University, Baton Rouge, Louisiana 70803, USA
  • 3Department of Physics, Tulane University, New Orleans, Louisiana 70118, USA
  • 4Department of Electrical and Computer Engineering, Louisiana State University, Baton Rouge, Louisiana 70803, USA

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Issue

Vol. 80, Iss. 6 — December 2009

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