Errors in trapped-ion quantum gates due to spontaneous photon scattering

R. Ozeri, W. M. Itano, R. B. Blakestad, J. Britton, J. Chiaverini, J. D. Jost, C. Langer, D. Leibfried, R. Reichle, S. Seidelin, J. H. Wesenberg, and D. J. Wineland
Phys. Rev. A 75, 042329 – Published 27 April 2007

Abstract

We analyze the error in trapped-ion, hyperfine qubit, quantum gates due to spontaneous scattering of photons from the gate laser beams. We investigate single-qubit rotations that are based on stimulated Raman transitions and two-qubit entangling phase gates that are based on spin-dependent optical dipole forces. This error is compared between different ion species currently being investigated as possible quantum-information carriers. For both gate types we show that with attainable laser powers the scattering error can be reduced to below current estimates of the fault-tolerance error threshold.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 6 November 2006

DOI:https://doi.org/10.1103/PhysRevA.75.042329

Authors & Affiliations

R. Ozeri*, W. M. Itano, R. B. Blakestad, J. Britton, J. Chiaverini, J. D. Jost, C. Langer, D. Leibfried, R. Reichle§, S. Seidelin, J. H. Wesenberg, and D. J. Wineland

  • NIST Boulder, Time and Frequency Division, Boulder, Colorado 80305, USA

  • *Present address: Weizmann Institute of Science, Rehovot, 76100 Israel.
  • Present address: Los Alamos National Laboratory, Los Alamos, NM 87545, USA.
  • Present address: Advanced Development Programs, Lockheed-Martin, Palmdale, CA 93599, USA.
  • §Present address: University of Ulm, 89069 Ulm, Germany.

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 75, Iss. 4 — April 2007

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review A

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×