Abstract
Accurate measurements are presented of the thickness of helium films on cleaved surfaces of alkaline-earth fluoride crystals at 1.38 . The films were measured between 10 and 250 Å using an acoustic interferometry technique. The data are in excellent agreement with calculations based on the Lifshitz theory of van der Waals forces. Calculations of the film thickness on a variety of other substrates are also given.
- Received 22 June 1972
DOI:https://doi.org/10.1103/PhysRevA.7.790
©1973 American Physical Society