Spectroscopic signature of strong dielectronic recombination in highly ionized xenon produced by irradiating a gas puff with laser

R. Doron, E. Behar, P. Mandelbaum, J. L. Schwob, H. Fiedorowicz, A. Bartnik, R. Jarocki, M. Szczurek, and T. Wilhein
Phys. Rev. A 59, 188 – Published 1 January 1999
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Abstract

Highly stripped xenon is produced by irradiating a gas-puff target with a laser pulse of 1-ns duration at an intensity of 1013W/cm2. The spectrum in the 16.5–19.5-Å wavelength range is measured using a grazing incidence diffractive spectrograph. Spectral lines of Fe-, Co-, Ni-, and Cu-like xenon arising from 3d4p radiative transitions are identified. A collisional-radiative model that includes dielectronic capture processes and radiation trapping is used to achieve the line identification and to describe the relative line intensities. The results of the model clearly show that the relatively strong intensities of the 3d94l3d84p4l Ni-like quasicontinuum emission between 17.8 and 18.4 Å arise from dielectronic recombination processes, which probably take place during the cooling phase of the plasma. The resonant nature of the dielectronic recombination processes enables us to diagnose the average electron temperature of the plasma during the recombination phase, and it is found to be about 150 eV.

  • Received 25 March 1998

DOI:https://doi.org/10.1103/PhysRevA.59.188

©1999 American Physical Society

Authors & Affiliations

R. Doron, E. Behar, P. Mandelbaum, and J. L. Schwob

  • Racah Institute of Physics, The Hebrew University, 91904 Jerusalem, Israel

H. Fiedorowicz, A. Bartnik, R. Jarocki, and M. Szczurek

  • Institute of Optoelectronics, Military University of Technology, 2 Kaliskiego Street, 01-489 Warsaw, Poland

T. Wilhein

  • Institute of X-Ray Physics, University of Göttingen, Geiststrasse 11, D-37073 Göttingen, Germany

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Vol. 59, Iss. 1 — January 1999

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