Sample-efficient benchmarking of multiphoton interference on a boson sampler in the sparse regime

Jelmer J. Renema, Hui Wang, Jian Qin, Xiang You, Chaoyang Lu, and Jianwei Pan
Phys. Rev. A 103, 023722 – Published 26 February 2021

Abstract

Verification of a quantum advantage in the presence of noise is a key open problem in the study of near-term quantum devices. In this work, we show how to assess the quality of photonic interference in a linear optical quantum device (boson sampler) by using a maximum likelihood method to measure the strength at which various noise sources are present in the experiment. This allows us to use a sparse set of samples to test whether a given boson-sampling experiment meets known upper bounds on the level of noise permissible to demonstrate a quantum advantage. Furthermore, this method allows us to monitor the evolution of noise in real time, creating a valuable diagnostic tool. Finally, we observe that sources of noise in the experiment compound, meaning that the observed value of the mutual photon indistinguishability, which is the main imperfection in our study, is an effective value taking into account all sources of error in the experiment.

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  • Received 20 August 2020
  • Accepted 11 February 2021

DOI:https://doi.org/10.1103/PhysRevA.103.023722

©2021 American Physical Society

Physics Subject Headings (PhySH)

Atomic, Molecular & OpticalQuantum Information, Science & Technology

Authors & Affiliations

Jelmer J. Renema1,*, Hui Wang2,3, Jian Qin2,3, Xiang You2,3, Chaoyang Lu2,3, and Jianwei Pan2,3

  • 1Mesa+ Institute for Nanotechnology, University of Twente, PO Box 217, 7500 AE Enschede, Netherlands
  • 2Hefei National Laboratory for Physical Sciences at Microscale and Department of Modern Physics, University of Science and Technology of China, Hefei, Anhui 230026, China
  • 3CAS Centre for Excellence and Synergetic Innovation Centre in Quantum Information and Quantum Physics, University of Science and Technology of China, Hefei, Anhui 230026, China

  • *j.j.renema@utwente.nl

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Vol. 103, Iss. 2 — February 2021

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