Mobility of Charge Carriers in Semiconducting Layer Structures

R. Fivaz and E. Mooser
Phys. Rev. 163, 743 – Published 15 November 1967
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Abstract

The electrical resistivities and the Hall constants of the compound semiconductors GaSe, MoS2, MoSe2, and WSe2, which crystallize in layer structures, have been measured at temperatures ranging from 100 to 700°K. The Hall mobilities derived from these measurements are all of the order of 100 cm2/V sec at room temperature, and they exhibit a temperature dependence of the form μ(TT0)n, where n=2.1 for GaSe, n=2.6 for MoS2, and n=2.4 for MoSe2 and WSe2. A short-range interaction is discussed which couples the charge carriers in highly anisotropic layer structures to the nonpolar optical lattice modes. The relatively low room-temperature mobilities as well as the high values of the exponents n are explained in terms of the proposed interaction.

  • Received 26 May 1967

DOI:https://doi.org/10.1103/PhysRev.163.743

©1967 American Physical Society

Authors & Affiliations

R. Fivaz* and E. Mooser

  • Cyanamid European Research Institute, Cologny, Geneva, Switzerland

  • *Present address: Department of Physics, Iowa State University, Ames, Iowa.

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Issue

Vol. 163, Iss. 3 — November 1967

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