Wave-Length Measurements in the M Series of Some High-Frequency Spectra

J. C. Karcher.
Phys. Rev. 15, 285 – Published 1 April 1920
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Abstract

Wave-length Measurements in the M Series of Some High Frequency Spectra: a New Vacuum X-ray Spectrograph.—The paper contains a description of an X-ray spectograph designed to be used in the same chamber containing the source of X-rays, also a description of the vacuum chamber, the method of sealing, and details of manipulation of the apparatus.

A method is described of determining the position of the photographic plate upon which the lines are photographed.

Experimental data. Some measurements are made of lines in the M series of bismuth, lead, thallium, mercury, gold, and platinum.

    DOI:https://doi.org/10.1103/PhysRev.15.285

    ©1920 American Physical Society

    Authors & Affiliations

    J. C. Karcher.

    • Randal Morgan Laboratory, University of Pennsylvania, Philadelphia, Pa.

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    Issue

    Vol. 15, Iss. 4 — April 1920

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