<span class="aps-inline-formula"><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><mn>4</mn><mrow><msup><mrow><mi>σ</mi></mrow><mrow><mo>−</mo><mn>1</mn><mn></mn></mrow></msup></mrow></math></span> Inner Valence Photoionization Dynamics of NO Derived from Photoelectron-Photoion Angular Correlations

O. Geßner; Y. Hikosaka; B. Zimmermann; A. Hempelmann; R. R. Lucchese; J. H. D. Eland; P.-M. Guyon; U. Becker

doi:10.1103/PhysRevLett.88.193002

$4 σ^{- 1}$ Inner Valence Photoionization Dynamics of NO Derived from Photoelectron-Photoion Angular Correlations

O. Geßner, Y. Hikosaka, B. Zimmermann, A. Hempelmann, R. R. Lucchese, J. H. D. Eland, P.-M. Guyon, and U. Becker

Phys. Rev. Lett. 88, 193002 – Published 30 April 2002

Abstract

A complete description of the $4 σ$ photoionization dynamics of NO has been derived from angle resolved photoelectron-photoion-coincidence experiments. The combination of measurements performed with linearly and circularly polarized light has made it possible to obtain a unique set of complex dipole matrix elements. A comparison with multichannel-Schwinger-configuration-interaction calculations shows good agreement in the general shapes of the angular distributions due to the correct description of the main components and phase differences. Still, many transition moments agree only qualitatively.

Received 4 February 2002

DOI:https://doi.org/10.1103/PhysRevLett.88.193002

Authors & Affiliations

O. Geßner¹, Y. Hikosaka², B. Zimmermann^1,*, A. Hempelmann¹, R. R. Lucchese³, J. H. D. Eland⁴, P.-M. Guyon⁵, and U. Becker¹

¹Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, 14195 Berlin, Germany
²Photon Factory, Institute of Materials Structure Science, KEK, Tsukuba, 305-0801, Japan
³Texas A&M University, Department of Chemistry, College Station, Texas 77842-3012
⁴Physical & Theoretical Chemistry Laboratory, South Parks Road, Oxford OX1 3QZ, United Kingdom
⁵Laboratoire des Collisions Atomiques et Moléculaire Bâtiment 351, Université Paris Sud, 91405 Orsay, France