Scanning Force Imaging of Atomic Size Defects on the CaF2(111) Surface

M. Reichling and C. Barth
Phys. Rev. Lett. 83, 768 – Published 26 July 1999
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Abstract

Cleaved (111) surfaces on CaF2 were imaged with scanning force microscopy operated in the dynamic mode in ultrahigh vacuum. Imaging the pristine surface reveals an atomic scale contrast with the structure expected for the fluorine terminated surface. We always reproduced the perfect surface periodicity never observing stable defects. However, after exposing the surface to 280 L of oxygen while constantly scanning, we detected stable atomically resolved defects that are assigned to OH groups incorporated into the surface. We could identify a jump of one of the groups from one atomic cell to the next. The observed contrast at regular lattice sites as well as at defects is discussed and qualitatively explained.

  • Received 25 January 1999

DOI:https://doi.org/10.1103/PhysRevLett.83.768

©1999 American Physical Society

Authors & Affiliations

M. Reichling* and C. Barth

  • Fachbereich Physik, Freie Universität Berlin, 14195 Berlin, Germany

  • *Corresponding author. Electronic address: reichling@physik.fu-berlin.de

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Vol. 83, Iss. 4 — 26 July 1999

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