Abstract
Simultaneous x-ray diffraction and four-probe electrical resistance measurements have been performed as a function of temperature on a polycrystalline sample of the high- material . Comparisons of the diffraction spectra between 290 and 18 K show no evidence of any gross structural distortions. Least-squares refinements of the tetragonal unit-cell parameters at several temperatures indicate smooth monotonic thermal expansions of about 0.10±0.05% along the a axis and about 0.35±0.10% along the c axis over this temperature range.
- Received 18 March 1987
DOI:https://doi.org/10.1103/PhysRevB.35.7140
©1987 American Physical Society