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Erratum: Oxide traps in Si-SiO<sub>2</sub> structures characterized by tunnel emission with deep-level transient spectroscopy
D. Vuillaume, J. C. Bourgoin, and M. Lannoo
Phys. Rev. B 35, 4118 (1987)
Erratum: Polaronic states in a slab of a polar crystal
Xi-Xia Liang, Shi-Wei Gu, and D. L. Lin
Phys. Rev. B 35, 4118 (1987)