Abstract
We consider both experimentally and analytically the transient oscillatory process that arises when a rapid change in voltage is applied to a ferroelectric thin film deposited on an Mg0 substrate. High frequency polarization oscillations are observed in the ferroelectric sample. These can be understood using a simple field-polarization model. In particular, we obtain analytic expressions for the oscillation frequency and the decay time of the polarization fluctuation in terms of the material parameters. These estimations agree well with the experimental results.
- Received 17 June 2010
DOI:https://doi.org/10.1103/PhysRevB.82.094113
©2010 American Physical Society
