Abstract
DOI:https://doi.org/10.1103/RevModPhys.5.169
©1933 American Physical Society
On the Factors Affecting the Reflection Intensities by the Several Methods of X-Ray Analysis of Crystal Structures
F. C. Blake
Rev. Mod. Phys. 5, 169 – Published 1 July 1933; Erratum Rev. Mod. Phys. 5, 288 (1933)
