Rev. Mod. Phys. 30, 172 (1958) - Temperature Characteristic of X-Ray Intensity Reflection from Crystals Having Zincblende- and Wurtzite- Type Structures

Temperature Characteristic of X-Ray Intensity Reflection from Crystals Having Zincblende- and Wurtzite- Type Structures

SHIZUO MIYAKE and SADAO HOSHINO

Rev. Mod. Phys. 30, 172 – Published 1 January 1958

Abstract

DOI:https://doi.org/10.1103/RevModPhys.30.172

©1958 American Physical Society

Authors & Affiliations

SHIZUO MIYAKE and SADAO HOSHINO^*

Tokyo Institute of Technology, Oh-Okayama, Tokyo, Japan

^*Now at Department of Physics, The Pennsylvania State University, University Park, Pennsylvania.

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Vol. 30, Iss. 1 — January - March 1958

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