Domain Pattern in Silicon-Iron under Stress

L. J. Dijkstra and U. M. Martius
Rev. Mod. Phys. 25, 146 – Published 1 January 1953
PDFExport Citation

Abstract

This paper discusses investigations into the detailed changes in domain structure of ferromagnetic material under externally applied stress. The changes in the domain pattern of grain-oriented silicon steel with large grain size were observed and photographed while the specimen was stressed in tension.

Experiments in which the grain under observation had the {110} plane in the surface of the specimen and the 110 direction parallel to the specimen axis, along which tension was applied, are discussed in detail. At a load of approximately 0.2 kg/mm2 the original domain pattern vanishes. After a transition stage in which, over a certain range of loads, no pattern is visible at all, a new stress-induced domain pattern appears. The behavior of these patterns in horizontal and vertical magnetic fields was studied, and an interpretation of both the transition stage and the stress-induced pattern is given. In these experiments the applied stresses are all within the elastic range of the material. In the plastic range, the knowledge of the stress-induced pattern permits the detection of residual lattice strains in suitably oriented materials.

    DOI:https://doi.org/10.1103/RevModPhys.25.146

    ©1953 American Physical Society

    Authors & Affiliations

    L. J. Dijkstra and U. M. Martius*

    • Ontario Research Foundation, Toronto, Ontario, Canada

    • *Mrs. F. Franklin.

    References (Subscription Required)

    Click to Expand
    Issue

    Vol. 25, Iss. 1 — January - March 1953

    Reuse & Permissions
    Access Options
    Author publication services for translation and copyediting assistance advertisement

    Authorization Required


    ×
    ×

    Images

    ×

    Sign up to receive regular email alerts from Reviews of Modern Physics

    Log In

    Cancel
    ×

    Search


    Article Lookup

    Paste a citation or DOI

    Enter a citation
    ×