• Open Access

Publisher’s Note: Hot Electrons Regain Coherence in Semiconducting Nanowires [Phys. Rev. X 7, 021016 (2017)]

Jonathan Reiner, Abhay Kumar Nayak, Nurit Avraham, Andrew Norris, Binghai Yan, Ion Cosma Fulga, Jung-Hyun Kang, Torsten Karzig, Hadas Shtrikman, and Haim Beidenkopf
Phys. Rev. X 7, 029902 – Published 26 May 2017

Abstract

  • Received 19 May 2017

DOI:https://doi.org/10.1103/PhysRevX.7.029902

Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

© 2017 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Article Text

Click to Expand

Original Article

Hot Electrons Regain Coherence in Semiconducting Nanowires

Jonathan Reiner, Abhay Kumar Nayak, Nurit Avraham, Andrew Norris, Binghai Yan, Ion Cosma Fulga, Jung-Hyun Kang, Torsten Karzig, Hadas Shtrikman, and Haim Beidenkopf
Phys. Rev. X 7, 021016 (2017)
Issue

Vol. 7, Iss. 2 — April - June 2017

Reuse & Permissions
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review X

Reuse & Permissions

It is not necessary to obtain permission to reuse this article or its components as it is available under the terms of the Creative Commons Attribution 4.0 International license. This license permits unrestricted use, distribution, and reproduction in any medium, provided attribution to the author(s) and the published article's title, journal citation, and DOI are maintained. Please note that some figures may have been included with permission from other third parties. It is your responsibility to obtain the proper permission from the rights holder directly for these figures.

×

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×