• Open Access

Terahertz Stimulated Emission from Silicon Doped by Hydrogenlike Acceptors

S. G. Pavlov, N. Deßmann, V. N. Shastin, R. Kh. Zhukavin, B. Redlich, A. F. G. van der Meer, M. Mittendorff, S. Winnerl, N. V. Abrosimov, H. Riemann, and H.-W. Hübers
Phys. Rev. X 4, 021009 – Published 10 April 2014

Abstract

Stimulated emission in the terahertz frequency range has been realized from boron acceptor centers in silicon. Population inversion is achieved at resonant optical excitation on the 1Γ8+1Γ7, 1Γ6, 4Γ8 intracenter transitions with a midinfrared free-electron laser. Lasing occurs on two intracenter transitions around 1.75 THz. The upper laser levels are the 1Γ7, 1Γ6, and 4Γ8 states, and the lower laser level for both emission lines is the 2Γ8+ state. In contrast to n-type intracenter silicon lasers, boron-doped silicon lasers do not involve the excited states with the longest lifetimes. Instead, the absorption cross section for the pump radiation is the dominating factor. The four-level lasing scheme implies that the deepest even-parity boron state is the 2Γ8+ state and not the 1Γ7+ split-off ground state, as indicated by other experiments. This is confirmed by infrared absorption spectroscopy of Si:B.

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  • Received 27 September 2013

DOI:https://doi.org/10.1103/PhysRevX.4.021009

This article is available under the terms of the Creative Commons Attribution 3.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

Published by the American Physical Society

Authors & Affiliations

S. G. Pavlov1, N. Deßmann2, V. N. Shastin3,4, R. Kh. Zhukavin3, B. Redlich5,6, A. F. G. van der Meer5,6, M. Mittendorff7, S. Winnerl7, N. V. Abrosimov8, H. Riemann8, and H.-W. Hübers1,2

  • 1Institute of Planetary Research, German Aerospace Center (DLR), 12489 Berlin, Germany
  • 2Institut für Optik und Atomare Physik, Technische Universität Berlin, 10623 Berlin, Germany
  • 3Institute for Physics of Microstructures, Russian Academy of Sciences, 603950 Nizhny Novgorod, Russia
  • 4Nizhny Novgorod State University, 603950 Nizhny Novgorod, Russia
  • 5FOM Institute for Plasma Physics Rijnhuizen, 3430 BE Nieuwegein, The Netherlands
  • 6Institute for Molecules and Materials, Radboud University Nijmegen, 6525 ED Nijmegen, The Netherlands
  • 7Helmholtz-Zentrum Dresden-Rossendorf, 01328 Dresden, Germany
  • 8Leibniz Institute for Crystal Growth, 12489 Berlin, Germany

Popular Summary

Today’s electronics is dominated by silicon. However, laser generation is difficult to realize with silicon for a fundamental reason: Silicon is a so-called indirect-band-gap semiconductor, in which an electron excited into the conduction band and the hole it leaves behind in the valance band do not have the same momentum. As a result, photon emission (or light generation) from a direct recombination of the electron and hole is forbidden. Doping silicon with either electron-giving (n-doping) donor atoms or electron-capturing (p-doping) acceptors has been used as a remedy for this problem. p-doped silicon (with boron) is a promising candidate because experimental and theoretical investigations indicate that its electronic structure can enable a four-level laser scheme. In this experimental paper, we demonstrate a boron-doped-silicon laser.

Our laser is obtained by optically pumping the boron acceptors into their high-energy excited states. This leads to population inversion between some of these states and, in turn, to laser emission at 1.740 THz and 1.748 THz, respectively. Unexpectedly, the upper laser states are not those with the longest lifetimes but states with rather short ones of approximately 50 ps. This also allows us to draw a few interesting conclusions on the energy structure of the excited states in Si:B, which has not been known very well. In particular, one excited state that was thought to have the second-largest binding energy turns out to have a significantly smaller one.

Our work demonstrates the feasibility of p-doped silicon lasers. More types of lasers based on p-doped silicon with different dopants and emission frequencies might be realized in the future.

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Vol. 4, Iss. 2 — April - June 2014

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