Abstract
Stimulated emission in the terahertz frequency range has been realized from boron acceptor centers in silicon. Population inversion is achieved at resonant optical excitation on the , , intracenter transitions with a midinfrared free-electron laser. Lasing occurs on two intracenter transitions around 1.75 THz. The upper laser levels are the , , and states, and the lower laser level for both emission lines is the state. In contrast to -type intracenter silicon lasers, boron-doped silicon lasers do not involve the excited states with the longest lifetimes. Instead, the absorption cross section for the pump radiation is the dominating factor. The four-level lasing scheme implies that the deepest even-parity boron state is the state and not the split-off ground state, as indicated by other experiments. This is confirmed by infrared absorption spectroscopy of Si:B.
- Received 27 September 2013
DOI:https://doi.org/10.1103/PhysRevX.4.021009
This article is available under the terms of the Creative Commons Attribution 3.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.
Published by the American Physical Society
Popular Summary
Today’s electronics is dominated by silicon. However, laser generation is difficult to realize with silicon for a fundamental reason: Silicon is a so-called indirect-band-gap semiconductor, in which an electron excited into the conduction band and the hole it leaves behind in the valance band do not have the same momentum. As a result, photon emission (or light generation) from a direct recombination of the electron and hole is forbidden. Doping silicon with either electron-giving (-doping) donor atoms or electron-capturing (-doping) acceptors has been used as a remedy for this problem. -doped silicon (with boron) is a promising candidate because experimental and theoretical investigations indicate that its electronic structure can enable a four-level laser scheme. In this experimental paper, we demonstrate a boron-doped-silicon laser.
Our laser is obtained by optically pumping the boron acceptors into their high-energy excited states. This leads to population inversion between some of these states and, in turn, to laser emission at 1.740 THz and 1.748 THz, respectively. Unexpectedly, the upper laser states are not those with the longest lifetimes but states with rather short ones of approximately 50 ps. This also allows us to draw a few interesting conclusions on the energy structure of the excited states in Si:B, which has not been known very well. In particular, one excited state that was thought to have the second-largest binding energy turns out to have a significantly smaller one.
Our work demonstrates the feasibility of -doped silicon lasers. More types of lasers based on -doped silicon with different dopants and emission frequencies might be realized in the future.