Stability of charged sulfur vacancies in 2D and bulk MoS2 from plane-wave density functional theory with electrostatic corrections

Anne Marie Z. Tan, Christoph Freysoldt, and Richard G. Hennig
Phys. Rev. Materials 4, 064004 – Published 3 June 2020

Abstract

Two-dimensional (2D) semiconducting transition metal dichalcogenides such as MoS2 have attracted extensive research interests for potential applications in optoelectronics, spintronics, photovoltaics, and catalysis. To harness the potential of these materials for electronic devices requires a better understanding of how defects control the carrier concentration, character, and mobility. Utilizing a correction scheme developed by Freysoldt and Neugebauer to ensure the appropriate electrostatic boundary conditions for charged defects in 2D materials, we perform density functional theory calculations to compute formation energies and charge transition levels associated with sulfur vacancies in monolayer and layered bulk MoS2. We investigate the convergence of these defect properties with respect to vacuum spacing, in-plane supercell dimensions, and different levels of theory. We also analyze the electronic structures of the defects in different charge states to gain insights into the effect of defects on bonding and magnetism. We predict that both vacancy structures undergo a Jahn-Teller distortion, which helps stabilize the sulfur vacancy in the 1 charged state.

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  • Received 6 March 2020
  • Accepted 19 May 2020

DOI:https://doi.org/10.1103/PhysRevMaterials.4.064004

©2020 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Anne Marie Z. Tan1,2,*, Christoph Freysoldt3, and Richard G. Hennig1,2,†

  • 1Department of Materials Science and Engineering, University of Florida, Gainesville, Florida 32611, USA
  • 2Quantum Theory Project, University of Florida, Gainesville, Florida 32611, USA
  • 3Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Straße 1, 40227 Düsseldorf, Germany

  • *annemarietan@ufl.edu
  • rhennig@ufl.edu

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Issue

Vol. 4, Iss. 6 — June 2020

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