Formation of graphene atop a Si adlayer on the C-face of SiC

Jun Li, Qingxiao Wang, Guowei He, Michael Widom, Lydia Nemec, Volker Blum, Moon Kim, Patrick Rinke, and Randall M. Feenstra
Phys. Rev. Materials 3, 084006 – Published 19 August 2019
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Abstract

The structure of the SiC(0001¯) surface, the C-face of the {0001} SiC surfaces, is studied as a function of temperature and of pressure in a gaseous environment of disilane (Si2H6). Various surface reconstructions are observed, both with and without the presence of an overlying graphene layer (which spontaneously forms at sufficiently high temperatures). Based on cross-sectional scanning transmission electron microscopy measurements, the interface structure that forms in the presence of the graphene is found to contain 1.4–1.7 monolayers (ML) of Si, a somewhat counter-intuitive result since, when the graphene forms, the system is actually under C-rich conditions. Using ab initio thermodynamics, it is demonstrated that there exists a class of Si-rich surfaces containing about 1.3 ML of Si that are stable on the surface (even under C-rich conditions) at temperatures above ∼400 K. The structures that thus form consist of Si adatoms atop a Si adlayer on the C-face of SiC, with or without the presence of overlying graphene.

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  • Received 20 May 2019

DOI:https://doi.org/10.1103/PhysRevMaterials.3.084006

©2019 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Jun Li1, Qingxiao Wang2, Guowei He1, Michael Widom1, Lydia Nemec3,*, Volker Blum4, Moon Kim2, Patrick Rinke3,5, and Randall M. Feenstra1,†

  • 1Department of Physics, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213, USA
  • 2Department of Materials Science and Engineering, The University of Texas at Dallas, Richardson, Texas 75080, USA
  • 3Fritz-Haber-Institut der Max-Planck-Gesellschaft, D-14195 Berlin, Germany
  • 4Department of Mechanical Engineering and Materials Science, Duke University, Durham, North Carolina 27708, USA
  • 5Department of Applied Physics, Aalto University, P.O. Box 11100, Aalto FI-00076, Finland

  • *Present address: Carl Zeiss AG Digital Innovation Partners, Kistlerhofstraße 70, 81379 Munich, Germany.
  • feenstra@andrew.cmu.edu

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Issue

Vol. 3, Iss. 8 — August 2019

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