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Layer dependence of third-harmonic generation in thick multilayer graphene

Hao Yang, Honghua Guan, Nicolas Biekert, Ghidewon Arefe, Damien C. Chang, Yawen Sun, Po-Chun Yeh, Xiaoping Liu, Sung-Young Hong, Ida Delač Marion, Marko Kralj, James C. Hone, Richard M. Osgood, Jr., and Jerry I. Dadap
Phys. Rev. Materials 2, 071002(R) – Published 3 July 2018

Abstract

We demonstrate experimental evidence for the existence of an optimal thickness that yields the maximum third-harmonic (TH) signal in thick multilayer graphene (MLG). We measure the layer-dependent TH signal from MLG on a quartz substrate for N graphene layers ranging from 3 to 50. Theoretical predictions of the layer-dependent TH signal are compared with experiment, including those measured using atomic force and optical microscopy. We find the optimal TH signal for N24, in good agreement with two theoretical models: one in which the graphene layers are assumed isolated but contribute coherently, and one in which the MLG is assumed as one continuous thin film. Our measurements reveal that for MLG, the stacking property of the linear and nonlinear conductivities are found to be remarkably preserved up to the very thick layers (N50), i.e., σN,g(i)=Nσg(i), where i=1 and 3, respectively, and σg(i) is the corresponding monolayer conductivity.

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  • Received 29 March 2018
  • Revised 25 May 2018

DOI:https://doi.org/10.1103/PhysRevMaterials.2.071002

©2018 American Physical Society

Physics Subject Headings (PhySH)

Condensed Matter, Materials & Applied Physics

Authors & Affiliations

Hao Yang1, Honghua Guan1, Nicolas Biekert2, Ghidewon Arefe3, Damien C. Chang3, Yawen Sun4, Po-Chun Yeh2, Xiaoping Liu1, Sung-Young Hong5, Ida Delač Marion6, Marko Kralj6, James C. Hone3, Richard M. Osgood, Jr.1,2, and Jerry I. Dadap1,*

  • 1Department of Electrical Engineering, Columbia University, New York, New York 10027, USA
  • 2Department of Applied Physics and Applied Mathematics, Columbia University, New York, New York 10027, USA
  • 3Department of Mechanical Engineering, Columbia University, New York, New York 10027, USA
  • 4School of Optical and Electronic Information, Huazhong University of Science and Technology, Wuhan 430074, China
  • 5Department of Chemistry, Columbia University, New York, New York 10027, USA
  • 6Center for Excellence for Advanced Materials and Sensing Devices, Institute of Physics, Bijenička 46, HR-10000 Zagreb, Croatia

  • *dadap.cumsl@gmail.com

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Issue

Vol. 2, Iss. 7 — July 2018

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