Abstract
We used infrared spectroscopic ellipsometry to investigate the electronic properties of superlattices (SLs). Our results indicated that, independent of the SL periodicity and individual layer thickness, the SLs exhibited a Drude metallic response with sheet carrier density per interface . This is probably due to the leakage of electrons at interfaces from the Mott insulator to the band insulator . We observed a carrier relaxation time and mobility at 10 K, and an unusual temperature dependence of carrier density that was attributed to the dielectric screening of quantum paraelectric .
- Received 6 March 2007
DOI:https://doi.org/10.1103/PhysRevLett.99.266801
©2007 American Physical Society