Probing Atomic Migration in Nanostructured Multilayers: Application of X-Ray Standing Wave Fields

S. Bera, K. Bhattacharjee, G. Kuri, and B. N. Dev
Phys. Rev. Lett. 98, 196103 – Published 10 May 2007

Abstract

X-ray standing wave fields, excited in periodic nanostructured multilayers during Bragg diffraction, have been used to probe atomic migration in multilayers. Ion beam induced migration of Fe impurity atoms from the C layers to the Pt layers in a Pt(Fe)/C(Fe) multilayer, where each layer is about 2 nm thick, has been detected. With a depth resolution better than 0.2 nm of this technique, the direction of Fe migration (here outward) and the change of Fe concentration in C (also Pt) layers have been determined. The results of such measurements are important for understanding the properties of multilayers, for example, the evolution of ferromagnetism in the present example [Dev et al., Microelectron. Eng. 83, 1721 (2006)].

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  • Received 13 January 2007

DOI:https://doi.org/10.1103/PhysRevLett.98.196103

©2007 American Physical Society

Authors & Affiliations

S. Bera1, K. Bhattacharjee1, G. Kuri2,†, and B. N. Dev1,3,*

  • 1Institute of Physics, Sachivalaya Marg, Bhubaneswar-751005, India
  • 2Hamburg Synchrotron Radiation Laboratory (HASYLAB) at DESY, Notkestrasse 85, D-22603 Hamburg, Germany
  • 3Indian Association for the Cultivation of Science, 2A and 2B Raja S. C. Mullick Road, Jadavpur, Kolkata 700032, India

  • *Email address: bhupen@iopb.res.in; msbnd@iacs.res.in
  • Present address: LWV, NES, Paul Scherrer Institute, 5232 Villigen PSI, Switzerland.

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Issue

Vol. 98, Iss. 19 — 11 May 2007

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