Direct XUV Probing of Attosecond Electron Recollision

Olga Smirnova, Sergei Patchkovskii, and Michael Spanner
Phys. Rev. Lett. 98, 123001 – Published 20 March 2007

Abstract

We demonstrate that the recolliding electron wave packet, fundamental to many strong field phenomena, can be directly imaged with sub-Å spatial and attosecond temporal resolution using attosecond extreme ultraviolet (XUV) pulses. When the recolliding electron revisits the parent ion, it can absorb an XUV photon yielding high energy electron and thereby providing a measurement of the electron energy at the moment of recollision. The full temporal evolution of the recollision wave packet can be reconstructed by measuring the photoelectron spectra for different time delays between the driving laser and the attosecond XUV probe. The strength of the photoelectron signal can be used to characterize the spatial distribution of the electron density in the longitudinal direction. Elliptical polarization can be used to characterize the electron probability in transversal direction.

  • Figure
  • Figure
  • Figure
  • Figure
  • Figure
  • Received 10 June 2006

DOI:https://doi.org/10.1103/PhysRevLett.98.123001

©2007 American Physical Society

Authors & Affiliations

Olga Smirnova1, Sergei Patchkovskii1, and Michael Spanner2

  • 1Steacie Institute for Molecular Science, National Research Council of Canada, Ottawa, Ontario, K1A 0R6 Canada
  • 2Chemical Physics Theory Group, Department of Chemistry, and Center for Quantum Information and Quantum Control, University of Toronto, Toronto, M5S 3H6 Canada

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 98, Iss. 12 — 23 March 2007

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×