Inelastic X-Ray Scattering Study of Exciton Properties in an Organic Molecular Crystal

K. Yang, L. P. Chen, Y. Q. Cai, N. Hiraoka, S. Li, J. F. Zhao, D. W. Shen, H. F. Song, H. Tian, L. H. Bai, Z. H. Chen, Z. G. Shuai, and D. L. Feng
Phys. Rev. Lett. 98, 036404 – Published 17 January 2007

Abstract

Excitons in a complex organic molecular crystal were studied by inelastic x-ray scattering (IXS) for the first time. The dynamic dielectric response function is measured over a large momentum transfer region, from which an exciton dispersion of 130 meV is observed. Semiempirical quantum chemical calculations reproduce well the momentum dependence of the measured dynamic dielectric responses, and thus unambiguously indicate that the lowest Frenkel exciton is confined within a fraction of the complex molecule. Our results demonstrate that IXS is a powerful tool for studying excitons in complex organic molecular systems. Besides the energy position, the IXS spectra provide a stringent test on the validity of the theoretically calculated exciton wave functions.

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  • Received 20 March 2006

DOI:https://doi.org/10.1103/PhysRevLett.98.036404

©2007 American Physical Society

Authors & Affiliations

K. Yang1, L. P. Chen2, Y. Q. Cai3, N. Hiraoka3, S. Li1, J. F. Zhao1, D. W. Shen1, H. F. Song4, H. Tian4, L. H. Bai1, Z. H. Chen1, Z. G. Shuai2,*, and D. L. Feng1,†

  • 1Department of Physics, and Applied Surface Physics State Key Laboratory, Fudan University, Shanghai 200433, China
  • 2Key Laboratory of Organic Solids, Beijing National Laboratory for Molecular Sciences (BNLMS), Institute of Chemistry, Chinese Academy of Sciences, Beijing 100080, China
  • 3National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan, Republic of China
  • 4Laboratory for Advanced Materials and Institute of Fine Chemicals, East China University of Science and Technology, Shanghai 200237, China

  • *Electronic address: zgshuai@iccas.ac.cn
  • Electronic address: dlfeng@fudan.edu.cn

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Issue

Vol. 98, Iss. 3 — 19 January 2007

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