Identification of Nanoscale Dissipation Processes by Dynamic Atomic Force Microscopy

R. Garcia, C. J. Gómez, N. F. Martinez, S. Patil, C. Dietz, and R. Magerle
Phys. Rev. Lett. 97, 016103 – Published 7 July 2006

Abstract

Identification of energy-dissipation processes at the nanoscale is demonstrated by using amplitude-modulation atomic force microscopy. The variation of the energy dissipated on a surface by a vibrating tip as a function of its oscillation amplitude has a shape that singles out the dissipative process occurring at the surface. The method is illustrated by calculating the energy-dissipation curves for surface energy hysteresis, long-range interfacial interactions and viscoelasticity. The method remains valid with independency of the amount of dissipated energy per cycle, from 0.1 to 50 eV. The agreement obtained between theory and experiments performed on silicon and polystyrene validates the method.

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  • Received 11 April 2006

DOI:https://doi.org/10.1103/PhysRevLett.97.016103

©2006 American Physical Society

Authors & Affiliations

R. Garcia1,*, C. J. Gómez1, N. F. Martinez1, S. Patil1, C. Dietz2, and R. Magerle2

  • 1Instituto de Microelectrónica de Madrid, CSIC, Isaac Newton 8, 28760 Tres Cantos, Madrid, Spain
  • 2Chemische Physik, Technische Universität Chemnitz, D-09107 Chemnitz, Germany

  • *Corresponding author. Electronic address: rgarcia@imm.cnm.csic.es

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Vol. 97, Iss. 1 — 7 July 2006

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