Polarization Dependence of L- and M-Edge Resonant Inelastic X-Ray Scattering in Transition-Metal Compounds

Michel van Veenendaal
Phys. Rev. Lett. 96, 117404 – Published 23 March 2006

Abstract

The resonant inelastic x-ray scattering (RIXS) cross section at the L and M edges of transition-metal compounds is studied using an effective scattering operator. The intensities of the elastic peak and for spin-flip processes are derived. It is shown how the polarization dependence can be used to select transitions. Comparisons are made with experiment. A detailed analysis of the polarization and angular dependence of L- and M-edge RIXS for divalent copper compounds, such as the high-Tc superconductors, is given.

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  • Received 19 December 2005

DOI:https://doi.org/10.1103/PhysRevLett.96.117404

©2006 American Physical Society

Authors & Affiliations

Michel van Veenendaal

  • Department of Physics, Northern Illinois University, De Kalb, Illinois 60115, USA and Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Avenue, Argonne, Illinois 60439, USA

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Issue

Vol. 96, Iss. 11 — 24 March 2006

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