Abstract
By combining dynamic force microscopy experiments and first-principles calculations, we have studied the adhesion associated with a single atomic contact between a nanoasperity—the tip apex—and a semiconductor surface—the . The nanoasperity’s termination has been atomically characterized by extensive comparisons of the measured short-range force at specific sites with the chemical forces calculated using many atomic models that vary in structure, composition, and relative orientation with respect to the surface. This thorough characterization has allowed us to explain the dissipation signal observed in atomic-resolution images and force spectroscopic measurements, as well as to identify a dissipation channel and the associated atomic processes.
- Received 16 December 2005
DOI:https://doi.org/10.1103/PhysRevLett.96.106101
©2006 American Physical Society