Single Atomic Contact Adhesion and Dissipation in Dynamic Force Microscopy

Noriaki Oyabu, Pablo Pou, Yoshiaki Sugimoto, Pavel Jelinek, Masayuki Abe, Seizo Morita, Rubén Pérez, and Óscar Custance
Phys. Rev. Lett. 96, 106101 – Published 15 March 2006
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Abstract

By combining dynamic force microscopy experiments and first-principles calculations, we have studied the adhesion associated with a single atomic contact between a nanoasperity—the tip apex—and a semiconductor surface—the Ge(111)c(2×8). The nanoasperity’s termination has been atomically characterized by extensive comparisons of the measured short-range force at specific sites with the chemical forces calculated using many atomic models that vary in structure, composition, and relative orientation with respect to the surface. This thorough characterization has allowed us to explain the dissipation signal observed in atomic-resolution images and force spectroscopic measurements, as well as to identify a dissipation channel and the associated atomic processes.

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  • Received 16 December 2005

DOI:https://doi.org/10.1103/PhysRevLett.96.106101

©2006 American Physical Society

Authors & Affiliations

Noriaki Oyabu1, Pablo Pou2, Yoshiaki Sugimoto1, Pavel Jelinek2,3, Masayuki Abe1, Seizo Morita1, Rubén Pérez2, and Óscar Custance1,*

  • 1Graduate School of Engineering, Osaka University, 2-1 Yamada-Oka, 565-0871 Suita, Osaka, Japan
  • 2Departamento de Física Teórica de la Materia Condensada, Universidad Autónoma de Madrid, 28049 Madrid, Spain
  • 3Institute of Physics, Academy of Sciences of the Czech Republic, Cukrovarnicka 10, 1862 53, Prague, Czech Republic

  • *Corresponding author. Email address: oscar@ele.eng.osaka-u.ac.jp

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Issue

Vol. 96, Iss. 10 — 17 March 2006

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