Charge-Fluctuation-Induced Dephasing of Exchange-Coupled Spin Qubits

Xuedong Hu and S. Das Sarma
Phys. Rev. Lett. 96, 100501 – Published 13 March 2006

Abstract

Exchange-coupled spin qubits in semiconductor nanostructures are shown to be vulnerable to dephasing caused by charge noise invariably present in the semiconductor environment. This decoherence of exchange gate by environmental charge fluctuations arises from the fundamental Coulombic nature of the Heisenberg coupling and presents a serious challenge to the scalability of the widely studied exchange gate solid state spin quantum computer architectures. We estimate dephasing times for coupled spin qubits in a wide range (from 1 ns up to >1μs) depending on the exchange coupling strength and its sensitivity to charge fluctuations.

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  • Received 26 July 2005

DOI:https://doi.org/10.1103/PhysRevLett.96.100501

©2006 American Physical Society

Authors & Affiliations

Xuedong Hu1 and S. Das Sarma2

  • 1Department of Physics, University at Buffalo, The State University of New York, 239 Fronczak Hall, Buffalo, New York 14260-1500, USA
  • 2Condensed Matter Theory Center, Department of Physics, University of Maryland, College Park, Maryland 20740-4111, USA

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Issue

Vol. 96, Iss. 10 — 17 March 2006

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