Four-Point Resistance of Individual Single-Wall Carbon Nanotubes

B. Gao, Y. F. Chen, M. S. Fuhrer, D. C. Glattli, and A. Bachtold
Phys. Rev. Lett. 95, 196802 – Published 31 October 2005

Abstract

We have studied the resistance of single-wall carbon nanotubes measured in a four-point configuration with noninvasive voltage electrodes. The voltage drop is detected using multiwalled carbon nanotubes while the current is injected through nanofabricated Au electrodes. The resistance at room temperature is shown to be linear with the length as expected for a classical resistor. This changes at cryogenic temperature; the four-point resistance then depends on the resistance at the Au-tube interfaces and can even become negative due to quantum-interference effects.

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  • Received 19 April 2005

DOI:https://doi.org/10.1103/PhysRevLett.95.196802

©2005 American Physical Society

Authors & Affiliations

B. Gao1, Y. F. Chen2, M. S. Fuhrer2, D. C. Glattli1,3, and A. Bachtold1,4,*

  • 1Laboratoire Pierre Aigrain, Ecole Normale Supérieure, 75231 Paris 05, France
  • 2Department of Physics and Center for Superconductivity Research, University of Maryland, College Park, Maryland 20742, USA
  • 3SPEC, CEA Saclay, F-91191 Gif-sur-Yvette, France
  • 4CNM-CSIC, Campus Universitat Autonoma de Barcelona, E-08193 Bellaterra, Spain

  • *Corresponding author. Email address: bachtold@lpa.ens.fr

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Issue

Vol. 95, Iss. 19 — 4 November 2005

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