Microstructure of Ferroelectric Domains in BaTiO3 Observed via X-Ray Microdiffraction

M. Holt, Kh. Hassani, and M. Sutton
Phys. Rev. Lett. 95, 085504 – Published 19 August 2005

Abstract

X-ray microdiffraction utilizing Fresnel zone plate focusing optics has been used to study microstructural properties of individual 90° ferroelectric domains in BaTiO3. Diffraction measurements at a microfocused spot resolution of 0.3μm over domain widths of 10μm unambiguously reveal features of lattice buckling, rotation, and strain near domain boundaries. Our results may be understood within the context of bound residual strain due to lattice mismatch and elastic interactions between neighboring domains.

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  • Received 2 March 2005

DOI:https://doi.org/10.1103/PhysRevLett.95.085504

©2005 American Physical Society

Authors & Affiliations

M. Holt*, Kh. Hassani, and M. Sutton

  • Physics Department, McGill University, Montreal, Quebec, Canada H3A 2T8

  • *Present address: X-ray Microscopy Group, Center for Nanoscale Materials, Advanced Photon Source, Argonne, IL, USA.
  • To whom correspondence should be addressed. Electronic address: mark@physics.mcgill.ca

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Issue

Vol. 95, Iss. 8 — 19 August 2005

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