Abstract
A new far-field optical microscopy capable of reaching nanometer-scale resolution is developed using the in-plane image magnification by surface plasmon polaritons. This approach is based on the optical properties of a metal-dielectric interface that may provide extremely large values of the effective refractive index up to as seen by surface polaritons, and thus the diffraction limited resolution can reach nanometer-scale values of . The experimental realization of the microscope has demonstrated the optical resolution better than 60 nm at 515 nm illumination wavelength.
- Received 10 March 2004
DOI:https://doi.org/10.1103/PhysRevLett.94.057401
©2005 American Physical Society