Novel Dielectric Anomaly in the Hole-Doped La2Cu1xLixO4 and La2xSrxNiO4 Insulators: Signature of an Electronic Glassy State

Tuson Park, Z. Nussinov, K. R. A. Hazzard, V. A. Sidorov, A. V. Balatsky, J. L. Sarrao, S.-W. Cheong, M. F. Hundley, Jang-Sik Lee, Q. X. Jia, and J. D. Thompson
Phys. Rev. Lett. 94, 017002 – Published 12 January 2005

Abstract

The low-frequency dielectric response of hole-doped insulators La2Cu1xLixO4 and La2xSrxNiO4 shows a large dielectric constant ε at high temperature and a steplike drop by a factor of 100 at a material-dependent low temperature Tf. Tf increases with frequency, and the dielectric response shows universal scaling in a Cole-Cole plot, suggesting that a charge-glass state is realized both in the cuprates and in the nickelates.

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  • Received 19 April 2004

DOI:https://doi.org/10.1103/PhysRevLett.94.017002

©2005 American Physical Society

Authors & Affiliations

Tuson Park1, Z. Nussinov1, K. R. A. Hazzard2, V. A. Sidorov1,*, A. V. Balatsky1, J. L. Sarrao1, S.-W. Cheong3, M. F. Hundley1, Jang-Sik Lee1, Q. X. Jia1, and J. D. Thompson1

  • 1Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA
  • 2Department of Physics, The Ohio State University, 174 West 18th Avenue, Columbus, Ohio 43210, USA
  • 3Department of Physics and Astronomy, Rutgers University and Bell Laboratories, Lucent Technologies, Murray Hill, New Jersey 07974, USA

  • *On leave from the Institute of High Pressure Physics, Russian Academy of Science, Troitsk, Russia.

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Vol. 94, Iss. 1 — 14 January 2005

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