Abstract
Using hard x-ray (HX; ) synchrotron photoemission spectroscopy (PES), we study the intrinsic electronic structure of (LSMO) thin films. Comparison of Mn core-levels with soft x-ray (SX; ) PES shows a clear additional well-screened feature only in HX PES. Takeoff-angle dependent data indicate its bulk () character. The doping and temperature dependence track the ferromagnetism and metallicity of the LSMO series. Cluster model calculations including charge transfer from doping-induced states show good agreement, confirming this picture of bulk properties reflected in Mn core-levels using HX PES.
- Received 19 May 2004
DOI:https://doi.org/10.1103/PhysRevLett.93.236401
©2004 American Physical Society