Localized Ferromagnetic Resonance in Inhomogeneous Thin Films

R. D. McMichael, D. J. Twisselmann, and Andrew Kunz
Phys. Rev. Lett. 90, 227601 – Published 3 June 2003

Abstract

The effect of sample inhomogeneity on the ferromagnetic resonance linewidth is determined by diagonalization of a spin wave Hamiltonian for ferromagnetic thin films with inhomogeneities spanning a wide range of characteristic length scales. A model inhomogeneity is used that consists of size D grains and an anisotropy field Hp that varies randomly from grain to grain in a film with thickness d and magnetization Ms. The resulting linewidth agrees well with the two-magnon model for small inhomogeneity, HpDπMsd. For large inhomogeneity, HpDπMsd, the precession becomes localized and the spectrum approaches that of local precession on independent grains.

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  • Received 23 December 2002

DOI:https://doi.org/10.1103/PhysRevLett.90.227601

©2003 American Physical Society

Authors & Affiliations

R. D. McMichael and D. J. Twisselmann

  • National Institute of Standards & Technology, Gaithersburg, Maryland 20899, USA

Andrew Kunz

  • Physics Department, Lawrence University, Appleton Wisconsin 54912, USA

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Issue

Vol. 90, Iss. 22 — 6 June 2003

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