• Featured in Physics
  • Free to Read

Mechanical Vertical Manipulation of Selected Single Atoms by Soft Nanoindentation Using Near Contact Atomic Force Microscopy

Noriaki Oyabu, Óscar Custance, Insook Yi, Yasuhiro Sugawara, and Seizo Morita
Phys. Rev. Lett. 90, 176102 – Published 2 May 2003
Physics logo
An article within the collection: Scanning Probe Microscopy: From Sublime to Ubiquitous

Abstract

A near contact atomic force microscope operated at low-temperature is used for vertical manipulation of selected single atoms from the Si(111)(7×7) surface. The strong repulsive short-range chemical force interaction between the closest atoms of both tip apex and surface during a soft nanoindentation leads to the removal of a selected silicon atom from its equilibrium position at the surface without additional perturbation of the (7×7) unit cell. Deposition of a single atom on a created vacancy at the surface is achieved as well. These manipulation processes are purely mechanical, since neither bias voltage nor voltage pulse is applied between probe and sample. Differences in the mechanical response of the two nonequivalent adatoms of the Si(111)(7×7) with the load applied is also detected.

  • Figure
  • Figure
  • Figure
  • Received 27 December 2002

DOI:https://doi.org/10.1103/PhysRevLett.90.176102

©2003 American Physical Society

Collections

This article appears in the following collection:

Scanning Probe Microscopy: From Sublime to Ubiquitous

This collection marks the 35th anniversary of scanning tunneling microscopy (STM) and the 30th anniversary of atomic force microscopy (AFM). These papers, all published in the Physical Review journals, highlight the positive impact that STM and AFM have had, and continue to have, on physical science research. The papers included in the collection have been made free to read.

Authors & Affiliations

Noriaki Oyabu1, Óscar Custance2,*, Insook Yi2, Yasuhiro Sugawara1,2, and Seizo Morita1,2

  • 1Graduate School of Engineering, Osaka University, 2-1 Yamada-Oka, Suita, 565-0871, Japan
  • 2Handai Frontier Research Center (FRC), 2-1 Yamada-Oka, Suita, 565-0871, Japan

  • *Corresponding author. Email address: oscar@ele.eng.osaka-u.ac.jp

See Also

How to Grab an Atom

Lea Winerman
Phys. Rev. Focus 11, 19 (2003)

Article Text

Click to Expand

References

Click to Expand
Issue

Vol. 90, Iss. 17 — 2 May 2003

Reuse & Permissions
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×