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High Resolution 3D X-Ray Diffraction Microscopy

Jianwei Miao, Tetsuya Ishikawa, Bart Johnson, Erik H. Anderson, Barry Lai, and Keith O. Hodgson
Phys. Rev. Lett. 89, 088303 – Published 6 August 2002; Erratum Phys. Rev. Lett. 111, 029901 (2013)
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Abstract

We have imaged a 2D buried Ni nanostructure at 8 nm resolution using coherent x-ray diffraction and the oversampling phasing method. By employing a 3D imaging reconstruction algorithm, for the first time we have experimentally determined the 3D structure of a noncrystalline nanostructured material at 50 nm resolution. The 2D and 3D imaging resolution is currently limited by the exposure time and the computing power, while the ultimate resolution is limited by the x-ray wavelengths. We believe these results pave the way for the development of atomic resolution 3D x-ray diffraction microscopy.

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  • Received 15 April 2002

DOI:https://doi.org/10.1103/PhysRevLett.89.088303

©2002 American Physical Society

Erratum

Erratum: High Resolution 3D X-Ray Diffraction Microscopy [Phys. Rev. Lett. 89, 088303 (2002)]

Jianwei Miao, Tetsuya Ishikawa, Bart Johnson, Erik H. Anderson, Barry Lai, and Keith O. Hodgson
Phys. Rev. Lett. 111, 029901 (2013)

Authors & Affiliations

Jianwei Miao1,*, Tetsuya Ishikawa2, Bart Johnson1, Erik H. Anderson3, Barry Lai4, and Keith O. Hodgson1,5

  • 1Stanford Synchrotron Radiation Laboratory, Stanford Linear Accelerator Center, Stanford University, Stanford, California 94309-0210
  • 2SPring-8/RIKEN, 1-1-1 Kouto, Mikazuki, Sayo-gun, Hyogo 679-5148, Japan
  • 3Center for X-ray Optics, Lawrence Berkeley National Laboratory, Berkeley, California 94720
  • 4Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439
  • 5Department of Chemistry, Stanford University, Stanford, California 94305

  • *Corresponding author. Email address: miao@ssrl.slac.stanford.edu

See Also

X Rays Stack Up

JR Minkel
Phys. Rev. Focus 10, 6 (2002)

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Issue

Vol. 89, Iss. 8 — 19 August 2002

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