Spin-Polarized Scanning Tunneling Microscopy with Antiferromagnetic Probe Tips

A. Kubetzka, M. Bode, O. Pietzsch, and R. Wiesendanger
Phys. Rev. Lett. 88, 057201 – Published 18 January 2002
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Abstract

We have performed low temperature spin-polarized scanning tunneling microscopy (SP-STM) of two monolayers Fe on W(110) using tungsten tips coated with different magnetic materials. We observe stripe domains with a magnetic period of 50±5nm. Employing Cr as a coating material we recorded SP-STM images with an antiferromagnetic probe tip. The advantage of its vanishing dipole field is most apparent in external magnetic fields. This new approach resolves the problem of the disturbing influence of a ferromagnetic tip in the investigation of soft magnetic materials and superparamagnetic particles.

  • Received 10 July 2001

DOI:https://doi.org/10.1103/PhysRevLett.88.057201

©2002 American Physical Society

Authors & Affiliations

A. Kubetzka*, M. Bode, O. Pietzsch, and R. Wiesendanger

  • Institute of Applied Physics and Microstructure Research Center, University of Hamburg, Jungiusstrasse 11, D-20355 Hamburg, Germany

  • *Email address: kubetzka@physnet.uni-hamburg.de

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Vol. 88, Iss. 5 — 4 February 2002

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