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Picometer Accuracy in Measuring Lattice Displacements Across Planar Faults by Interferometry in Coherent Electron Diffraction

Lijun Wu, Yimei Zhu, and J. Tafto
Phys. Rev. Lett. 85, 5126 – Published 11 December 2000
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Abstract

We calculate the shadow image in far field below a thin crystal when a coherent electron source is placed at micrometer distances above the specimen, and note that the presence of a planar fault results in very strong oscillatory contrast. We realize these predictions experimentally using a field-emission electron source in a microscope. With this technique, we determine displacement vectors at planar faults with an accuracy down to 1 pm in studies of the Bi2Sr2CaCu2O8 superconductor containing thin intercalated layers.

  • Received 12 June 2000

DOI:https://doi.org/10.1103/PhysRevLett.85.5126

©2000 American Physical Society

Authors & Affiliations

Lijun Wu, Yimei Zhu*, and J. Tafto

  • Materials Science Division, Brookhaven National Laboratory, Upton, New York 11973

  • *Corresponding author. Email address: zhu@bnl.gov
  • Visiting scientist from University of Oslo, Norway.

See Also

The Most Accurate Defect Measurement

Phys. Rev. Focus 6, 26 (2000)

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Issue

Vol. 85, Iss. 24 — 11 December 2000

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