Abstract
We calculate the shadow image in far field below a thin crystal when a coherent electron source is placed at micrometer distances above the specimen, and note that the presence of a planar fault results in very strong oscillatory contrast. We realize these predictions experimentally using a field-emission electron source in a microscope. With this technique, we determine displacement vectors at planar faults with an accuracy down to 1 pm in studies of the superconductor containing thin intercalated layers.
- Received 12 June 2000
DOI:https://doi.org/10.1103/PhysRevLett.85.5126
©2000 American Physical Society