Second Layer Nucleation in Thin Film Growth

Jörg Rottler and Philipp Maass
Phys. Rev. Lett. 83, 3490 – Published 25 October 1999
PDFExport Citation

Abstract

We study the second layer nucleation on top of islands emerging during epitaxial growth of thin films. By employing kinetic Monte Carlo simulations we determine the critical island radius Rc upon which small stable nuclei form in the second layer. We find that the dependence of Rc on the additional step edge barrier ΔEs (Schwoebel barrier) is not in accordance with existing theories. Scaling arguments are presented which explain how Rc depends on ΔEs as well as on adatom diffusion rates and on the incoming atom flux. Based on the theory, the occurrence of smooth layer-by-layer growth as opposed to rough multilayer growth is discussed.

  • Received 24 June 1999

DOI:https://doi.org/10.1103/PhysRevLett.83.3490

©1999 American Physical Society

Authors & Affiliations

Jörg Rottler and Philipp Maass

  • Fakultät für Physik, Universität Konstanz, D-78457 Konstanz, Germany

References (Subscription Required)

Click to Expand
Issue

Vol. 83, Iss. 17 — 25 October 1999

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×