Atomic Structure of the GaAs(001)(2×4) Surface Resolved Using Scanning Tunneling Microscopy and First-Principles Theory

V. P. LaBella, H. Yang, D. W. Bullock, P. M. Thibado, Peter Kratzer, and Matthias Scheffler
Phys. Rev. Lett. 83, 2989 – Published 11 October 1999
PDFExport Citation

Abstract

The atomic arrangement of the technologically important As-rich GaAs(001)(2×4) reconstructed surface is determined using bias-dependent scanning tunneling microscopy (STM) and first-principles electronic structure calculations. The STM images reveal the relative position and depth of the atomic-scale features within the trenches between the top-layer As dimers, which are in agreement with the β2(2×4) structural model. The bias-dependent simulated STM images reveal that a retraction of the topmost dangling bond orbitals is the novel electronic mechanism that enables the STM tip to image the trench structure.

  • Received 11 February 1999

DOI:https://doi.org/10.1103/PhysRevLett.83.2989

©1999 American Physical Society

Authors & Affiliations

V. P. LaBella, H. Yang, D. W. Bullock, and P. M. Thibado

  • Department of Physics, The University of Arkansas, Fayetteville, Arkansas 72701

Peter Kratzer and Matthias Scheffler

  • Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, D-14195 Berlin (Dahlem), Germany

References (Subscription Required)

Click to Expand
Issue

Vol. 83, Iss. 15 — 11 October 1999

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×