Abstract
The atomic arrangement of the technologically important As-rich reconstructed surface is determined using bias-dependent scanning tunneling microscopy (STM) and first-principles electronic structure calculations. The STM images reveal the relative position and depth of the atomic-scale features within the trenches between the top-layer As dimers, which are in agreement with the structural model. The bias-dependent simulated STM images reveal that a retraction of the topmost dangling bond orbitals is the novel electronic mechanism that enables the STM tip to image the trench structure.
- Received 11 February 1999
DOI:https://doi.org/10.1103/PhysRevLett.83.2989
©1999 American Physical Society