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Observation of Molecular Layering in Thin Liquid Films Using X-Ray Reflectivity

C.-J. Yu, A. G. Richter, A. Datta, M. K. Durbin, and P. Dutta
Phys. Rev. Lett. 82, 2326 – Published 15 March 1999
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Abstract

We report the direct observation of internal layering in thin ( 4590) liquid films of nearly spherical, nonpolar molecules, tetrakis(2-ethylhexoxy)silane, using synchrotron x-ray reflectivity. The Patterson functions have secondary maxima indicating layer formation, and model-independent fitting to the reflectivity data shows that there are three electron density oscillations near the solid-liquid interface, with a period of 10 (consistent with the molecular dimensions). The oscillation amplitude has a strong inverse dependence on the substrate surface roughness.

  • Received 20 November 1998

DOI:https://doi.org/10.1103/PhysRevLett.82.2326

©1999 American Physical Society

Authors & Affiliations

C.-J. Yu, A. G. Richter, A. Datta, M. K. Durbin, and P. Dutta

  • Department of Physics and Astronomy, Northwestern University, Evanston, Illinois 60208-3112

See Also

When a Liquid Is Not a Liquid

David Appell
Phys. Rev. Focus 3, 16 (1999)

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Vol. 82, Iss. 11 — 15 March 1999

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