Time-Resolved Speckle Analysis: A New Approach to Coherence and Dephasing of Optical Excitations in Solids

W. Langbein, J. M. Hvam, and R. Zimmermann
Phys. Rev. Lett. 82, 1040 – Published 1 February 1999
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Abstract

A new method to measure the time-dependent coherence of both homogeneously and inhomogeneously broadened optical excitations in solids is presented. The coherence degree of resonantly excited light emission is deduced from the intensity fluctuations over the emission directions (speckles). This method determines the decays of intensity and coherence separately, thus distinguishing lifetime from pure dephasing. The secondary emission of excitons in semiconductor quantum wells is investigated. Here the combination of static disorder and inelastic scattering leads to a partially coherent emission. The temperature dependence is well explained by phonon scattering.

  • Received 11 September 1998

DOI:https://doi.org/10.1103/PhysRevLett.82.1040

©1999 American Physical Society

Authors & Affiliations

W. Langbein and J. M. Hvam

  • Mikroelektronik Centret, The Technical University of Denmark, Building 345 east, DK-2800 Lyngby, Denmark

R. Zimmermann

  • Institut für Physik der Humboldt-Universität zu Berlin, Hausvogteiplatz 5-7, D-10117 Berlin, Germany

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Vol. 82, Iss. 5 — 1 February 1999

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