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Subangstrom Resolution by Underfocused Incoherent Transmission Electron Microscopy

P. D. Nellist and S. J. Pennycook
Phys. Rev. Lett. 81, 4156 – Published 9 November 1998
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Abstract

It is quantitatively explained why incoherent transmission electron microscope imaging is extremely robust to the effects of chromatic aberration, which usually limits the resolution in the conventional coherent mode of imaging. Combining this robustness with using underfocus to counter the effects of spherical aberration, we demonstrate subangstrom lattice resolution and information transfer to 0.078 nm.

  • Received 24 June 1998

DOI:https://doi.org/10.1103/PhysRevLett.81.4156

©1998 American Physical Society

Authors & Affiliations

P. D. Nellist1,* and S. J. Pennycook2

  • 1Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE, United Kingdom
  • 2Oak Ridge National Laboratory, Solid State Division, P.O. Box 2008, Oak Ridge, Tennessee 37831-6030

  • *Now at Nanoscale Physics Research Laboratory, School of Physics and Astronomy, The University of Birmingham, U.K. Electronic address: P.D.Nellist@bham.ac.uk

See Also

Highest Resolution Images of a Crystal

Phys. Rev. Focus 2, 24 (1998)

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Issue

Vol. 81, Iss. 19 — 9 November 1998

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