Nanoscale Structuring by Misfit Dislocations in Si1xGex/Si Epitaxial Systems

S. Yu. Shiryaev, F. Jensen, J. Lundsgaard Hansen, J. Wulff Petersen, and A. Nylandsted Larsen
Phys. Rev. Lett. 78, 503 – Published 20 January 1997
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Abstract

New capabilities of misfit dislocations for spatial manipulation of islands in Si1xGex/Si heteroepitaxial systems have been elucidated. Formation of highly ordered Ge-island patterns on substrates prestructured by slip bands of misfit dislocations is revealed. The major sources leading to the ordering are identified to be dislocation strain fields at the surface and modifications of the near-surface-layer morphology induced by dislocation slip.

  • Received 22 March 1996

DOI:https://doi.org/10.1103/PhysRevLett.78.503

©1997 American Physical Society

Authors & Affiliations

S. Yu. Shiryaev1, F. Jensen2, J. Lundsgaard Hansen1, J. Wulff Petersen2, and A. Nylandsted Larsen1

  • 1Institute of Physics and Astronomy, University of Aarhus, DK-8000 Aarhus C, Denmark
  • 2Mikroelektronik Centret, Building 345 East, The Technical University of Denmark, DK-2800 Lyngby, Denmark

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Vol. 78, Iss. 3 — 20 January 1997

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