Si3Oy ( y=16) Clusters: Models for Oxidation of Silicon Surfaces and Defect Sites in Bulk Oxide Materials

Lai-Sheng Wang, John B. Nicholas, Michel Dupuis, Hongbin Wu, and Steven D. Colson
Phys. Rev. Lett. 78, 4450 – Published 9 June 1997
PDFExport Citation

Abstract

We studied the structure and bonding of a series of silicon oxide clusters, Si3Oy (y=16), using anion photoelectron spectroscopy and ab initio calculations. For y=13 the clusters represent the sequential oxidation of Si3, and provide structural models for the oxidation of silicon surfaces. For y=46, the clusters contain a central Si in a tetrahedral bonding environment, suggesting the onset of the bulklike structure. Evidence is presented that suggests the Si3O4 cluster (D2d) may provide a structural model for oxygen-deficient defect sites in bulk SiO2 materials.

  • Received 6 December 1996

DOI:https://doi.org/10.1103/PhysRevLett.78.4450

©1997 American Physical Society

Authors & Affiliations

Lai-Sheng Wang1,2, John B. Nicholas2, Michel Dupuis2, Hongbin Wu1, and Steven D. Colson2

  • 1Department of Physics, Washington State University, Richland, Washington 99352
  • 2Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, Washington 99352

References (Subscription Required)

Click to Expand
Issue

Vol. 78, Iss. 23 — 9 June 1997

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×